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The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy

Oksana Vyacheslavovna Kotova 1
Oksana Vyacheslavovna Kotova
,  , 
Elena Vladimirovna Perevedentseva 3
Elena Vladimirovna Perevedentseva
, 
Tatyana Fedorovna Limonova 3
Tatyana Fedorovna Limonova
, 
Raida Askel'bekovna Baigeldieva 3
Raida Askel'bekovna Baigeldieva
, 
Aleksei Grigorievich Vitukhnovsky 3
Aleksei Grigorievich Vitukhnovsky
, 
Nataliya Petrovna Kuzmina 2
Nataliya Petrovna Kuzmina
10.1070/MC2004v014n04ABEH001963
Published 2004-09-07
Communication , Volume 14, Issue 4, 155-157
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Kotova O. V. et al. The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy // Mendeleev Communications. 2004. Vol. 14. No. 4. pp. 155-157.
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Kotova O. V., Eliseeva S. V., Perevedentseva E. V., Limonova T. F., Baigeldieva R. A., Vitukhnovsky A. G., Kuzmina N. P. The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy // Mendeleev Communications. 2004. Vol. 14. No. 4. pp. 155-157.
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TY - JOUR
DO - 10.1070/MC2004v014n04ABEH001963
UR - https://mendcomm.colab.ws/publications/10.1070/MC2004v014n04ABEH001963
TI - The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy
T2 - Mendeleev Communications
AU - Kotova, Oksana Vyacheslavovna
AU - Eliseeva, Svetlana Valer'evna
AU - Perevedentseva, Elena Vladimirovna
AU - Limonova, Tatyana Fedorovna
AU - Baigeldieva, Raida Askel'bekovna
AU - Vitukhnovsky, Aleksei Grigorievich
AU - Kuzmina, Nataliya Petrovna
PY - 2004
DA - 2004/09/07
PB - Mendeleev Communications
SP - 155-157
IS - 4
VL - 14
ER -
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@article{2004_Kotova,
author = {Oksana Vyacheslavovna Kotova and Svetlana Valer'evna Eliseeva and Elena Vladimirovna Perevedentseva and Tatyana Fedorovna Limonova and Raida Askel'bekovna Baigeldieva and Aleksei Grigorievich Vitukhnovsky and Nataliya Petrovna Kuzmina},
title = {The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy},
journal = {Mendeleev Communications},
year = {2004},
volume = {14},
publisher = {Mendeleev Communications},
month = {Sep},
url = {https://mendcomm.colab.ws/publications/10.1070/MC2004v014n04ABEH001963},
number = {4},
pages = {155--157},
doi = {10.1070/MC2004v014n04ABEH001963}
}
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Kotova, Oksana Vyacheslavovna, et al. “The topography of organic light-emitting diode-component functional layers as studied by atomic force microscopy.” Mendeleev Communications, vol. 14, no. 4, Sep. 2004, pp. 155-157. https://mendcomm.colab.ws/publications/10.1070/MC2004v014n04ABEH001963.

Abstract

The layer-by-layer roughness of organic light-emitting diode (OLED)-component functional thin films deposited from different solvents by a spin-coating method was studied using atomic force microscopy (AFM) facilities

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