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A low-temperature X-ray diffraction study of the Cu2ZnSnSe4 thin films

Aliona Viktorovna Stanchik 1
Aliona Viktorovna Stanchik
, 
Vital A Chumak 1
Vital A Chumak
, 
Valery F Gremenok 1
Valery F Gremenok
, 
Siarhei M Baraishuk 2
Siarhei M Baraishuk
2 Department of Practical Training of Students, Belorussian State Technical Agrarian University, Minsk, Belarus
10.1016/j.mencom.2021.09.045
Published 2021-09-08
Communication , Volume 31, Issue 5, 726-727
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Stanchik A. V. et al. A low-temperature X-ray diffraction study of the Cu2ZnSnSe4 thin films // Mendeleev Communications. 2021. Vol. 31. No. 5. pp. 726-727.
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Stanchik A. V., Chumak V. A., Gremenok V. F., Baraishuk S. M. A low-temperature X-ray diffraction study of the Cu2ZnSnSe4 thin films // Mendeleev Communications. 2021. Vol. 31. No. 5. pp. 726-727.
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TY - JOUR
DO - 10.1016/j.mencom.2021.09.045
UR - https://mendcomm.colab.ws/publications/10.1016/j.mencom.2021.09.045
TI - A low-temperature X-ray diffraction study of the Cu2ZnSnSe4 thin films
T2 - Mendeleev Communications
AU - Stanchik, Aliona Viktorovna
AU - Chumak, Vital A
AU - Gremenok, Valery F
AU - Baraishuk, Siarhei M
PY - 2021
DA - 2021/09/08
PB - Mendeleev Communications
SP - 726-727
IS - 5
VL - 31
ER -
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@article{2021_Stanchik,
author = {Aliona Viktorovna Stanchik and Vital A Chumak and Valery F Gremenok and Siarhei M Baraishuk},
title = {A low-temperature X-ray diffraction study of the Cu2ZnSnSe4 thin films},
journal = {Mendeleev Communications},
year = {2021},
volume = {31},
publisher = {Mendeleev Communications},
month = {Sep},
url = {https://mendcomm.colab.ws/publications/10.1016/j.mencom.2021.09.045},
number = {5},
pages = {726--727},
doi = {10.1016/j.mencom.2021.09.045}
}
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Stanchik, Aliona Viktorovna, et al. “A low-temperature X-ray diffraction study of the Cu2ZnSnSe4 thin films.” Mendeleev Communications, vol. 31, no. 5, Sep. 2021, pp. 726-727. https://mendcomm.colab.ws/publications/10.1016/j.mencom.2021.09.045.

Keywords

Cu2ZnSnSe4
electrochemical deposition
flexible metal substrates
low-temperature X-ray studies
thin films

Abstract

Low-temperature XRD measurements were performed to confirm the phase composition and structural parameters of the electrochemically deposited Cu2ZnSnSe4 thin films on flexible metal substrates.

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